Spectrometers help analyze semiconductor materials—such as silicon wafers—by providing data on thickness, crystal structure, and composition. Techniques like X-ray fluorescence (XRF) and Fourier transform infrared (FTIR) spectroscopy are often employed to accurately measure these. From plasma monitoring to endpoint detection, Ocean Optics provides compact spectral sensing solutions to streamline semiconductor manufacturing processes. The result? Accelerated time to market, higher process yields, and improved product quality. Residual gas analysers, RGA provide for vacuum diagnostics, contamination monitoring, leak detection and process gas analysis. Hiden Analytical. For semiconductor research and development, among other techniques, FT-IR and related spectroscopy stands out as an easy and effective tool to investigate the fundamentals of semiconductors.
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